The Charon project seeks to model electrical semiconductor devices such as transistors at high fidelities. By applying finite element & massively parallel solver technology, the tool is capable of modeling at unprecedented fidelity including transient gamma and neutron irradiation effects.
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Rob Hoekstra - Program Lead

Gary Hennigan - Lead Developer

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Product Overview

Charon is a modern, fully-parallel device simulation code employing state-of-the-art discretization and solutions methods to advance capabilities in device-scale modeling. Its development is currently being driven by the demands of QASPR, Sandia’s effort to help offset the loss of fast-transient neutron testing facilities for hostile environments qualification testing with modeling and simulation combined with enduring testing capabilities. In supporting this mission, Charon is also developing the world’s most advanced radiation aware device performance and defect modeling capabilities internal to its physics formulation. Additionally, and most importantly, when complete, these capabilities will also be rigorously verified and validated to ensure accurate solutions to problems where design margins are a critical driver.

 
 
To learn more about Charon, visit the Charon website.

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Product Highlights

 
  • Size - Capability to solve extremely high fidelity semiconductor device problems including support for radiation effects due to the massively parallel, distributed memory capability. Existing commercial codes are typically limited to simulating problems with less than 106 elements while Charon will support problems with up to 108 elements.
  • Robustness & Accuracy – Application of stabilized finite element techniques and advanced numerical algorithms allow unprecedented robustness and accuracy of solution. Charon is also implementing rigorous verification and validation practices within its practices and as part of QASPR to help ensure reliable and predictive solutions.
  • Applicability – User control of radiation defect physics allows the analyst to easily research candidate mechanisms and the sensitivity of a device to such mechanisms.
 

 
 
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